Metromeet, the only European Conference on Industrial Dimensional Metrology, will bring together during two days in Bilbao, Spain, the leading companies and organisations: NASA, NIST, Innovalia Metrology, SEAT, BMW, Renishaw, Mitutoyo and many more. Metromeet, organised by Innovalia Association and sponsorized by Innovalia Metrology, will be held in Bilbao, Spain, on 25th and 26th February 2010.

Metromeet will feature international renowned experts who will give the 2 tutorials, 20 presentations and 4 keynotes that make up the Programme of the 6th edition of the Conference. In order to cover all the aspects of metrology, the presentations will be divided into several tracks: Optical Metrology, Metrology Solutions, Industrial Metrology, Calibration & Verification, Nano & Micro metrology, and Metrological Software. Between the speakers of Metromeet, stand out names like Dr. William Zhang (NASA Goddard Space Flight Center), Marcin B. Bauza (InsituTec Inc), Dr. Han Haitjema (Mitutoyo Research Center Europe B.V.), Toni Ventura-Traveset (Innovalia Metrology), Dr. Ing. Dietrich Imkamp (Carl Zeiss Indutrial Metrology) and Martin Wäny (AWAIBA).

Metromeet is a unique opportunity for companies, because it is consolidated as an ideal meeting point for making new contacts and develop business networks. In time of economic stress, invest in training is key: in Metromeet you will learn how to improve the quality of your products and the efficiency of your industrial processes. All information concerning the conference is available at www.metromeet.org.