8th international Conference on Software QA and Testing on Embedded Systems
Metromeet helds the 6th edition in Bilbao, Spain

The 6th edition of Metromeet, the Europe’s leading conference on Industrial Dimensional Metrology, will be held in Bilbao, Spain, and will bring together speakers from exceptional organisms and companies, like NASA, NIST, Seat and Innovalia Metrology. The opening of Metromeet will take place at 12 and Xabier Sabalza, Director of Innovation and Information Society of the Industry, Innovation, Commerce and Tourism Department of the Basque Government, will be the special guest.

Metromeet will meet speakers from Europe and USA, representing companies of unquestionable prestige, which will give two tutorials, four keynotes and 20 presentations of the Programme. Metromeet will cover a wide range of thematic areas, like metrological software, calibration and verification, industrial metrology and micro & nanometrology, that becomes especially important with speakers like; Jon Villarubia, expert from NIST on nanometer-scale dimensional metrology, Oscar Lazaro, from Innovalia Association, who will explain the last developments of NanoCMM project, Enrs Treffers, specialist in the new generation of micro parts, and Dr.-Ing. Eberhard Manske, who will explain the steps to achieve 3D nanometric measurements.

In addition, four renowned speakers will give the keynotes of the Conference: Martin Wany, CEO of AWAIBA, will focus on the latest trends in sensor technology, and Dr. Han Hajetma, from Mitutoyo, will raise the problems of designing surface texture measuring instruments. On Friday 26, Maurizio Ercole will take an overall analysis after almost 50 years of Co-ordinate Measuring Machines and, finally, William Zhang, of NASA Goddard Space Flight Center will present the latest developments and trends in the sector of aeronautical metrology.