Programme
La candidature d’exposants prendra fin le 31 juillet. Le programme sera publié une fois la sélection des exposants réalisée par le Comité Technique.
Bandwidth characteristics and comparisons of surface texture measuring instruments Dr. Han Haitjema - Mitutoyo Research Center Europe B.V. 
Present and future of image sensors. (How megapixel sensor technology can help optical metrology) Martin Wäny - AWAIBA
Co-ordinate Measuring Machines; an overall analysis after almost 50 years. Dr. Maurizio Ercole - Independent Researcher
Aeronautical Metrology Dr. William Zhang - NASA Goddard Space Flight Center
A 100 million 3D pointcloud, and now what? The art of transforming massive data in useful knowledge Antonio Ventura - Traveset - Datapixel
Interferometric length measurements Prof. Erkki Ikonen - Metrology Research Institute Helsinki University of Technology
Comparison between 3D Metrology Results gained with conventional CMM and High Resolution X-ray Tomography Jens Luebbehuesen - GE's Sensing & Inspection Technologies business
Nano-CMM instrumentation for large volume characterization of 3D micro-features: The Nano-CMM approach Dr. Oscar Lazaro - Asociacion Innovalia
Machine tool spindle measurement Don Martin - Lion Precision
Laser scanning performance Vs traditional contact measurement Borja de la Maza - Innovalia
Lens assembly of laser diode stacks Dr. Sead Doric - Doric Lenses
Optical and Tactile- Comparisons in Contour and Surface Metrology Dr. -Ing. Dietrich Imkamp - Carl Zeiss Indutrial Metrology
Precision in the AutoEmoción Ramon Paricio - SEAT
Traceable Measurement of 3D Microparts Marijn van Veghel - VSL
Quality control in aerospace precision castings manufacturing process. Advances and challenges Ignacio Dominguez - PCB
Next generation of micro parts Ernst Treffers - Xpress Precision Engineering
Microscale surface and form profilometry using a standing wave probe Dr. Marcin B. Bauza - InsituTec Inc
Nanopositioning and Nanomeasuring Machines – 3D from Macro to Nano Prof. Dr.-Ing. Eberhard Manske - Ilmenau University
Uncertainty determination for CMMs -- Don´t forget the influence of feature form deviations Nick Van Gestel - Dimensional Metrology at Sirris and K.U.Leuven 
Verification of coordinate measuring machines according to ISO 10360-2 Felipe Pereda - Unimetrik
Modeling for Industrial Nanometer-Scale Size Metrology Dr. John Villarrubia - NIST
Metrological Software Validation Maite Tamayo - Michal Janiszek - SQS
Software advances for high performance tactile scanning Jordi Blanco - Renishaw
The development of optical metrology software during the years. An overview of available tools, the special needs for optical metrology data and actual trends. Gerd Schwaderer - Geomagic