Programa
En
esto momentos estamos elaborando el programa de la 5ª edición de Metromeet.
Estos son algunos de los ponentes que participarán en esta próxima edición. Visite regularmente la página de Metromeet para consultar las novedades.
Keynotes
- Large-area nanometer precision overlay in scanning-beam interference lithography, Ralf K Heilmann - Space Nanotechnology Laboratory
- Nanotechnology: An Overview and Impact on Metrology, Dr. Meyya Meyyappan - NASA Ames Research Center
- DMIS interoperability, Bill Rippey - NIST
Tutoriales
- Presentation title pending on confirmation, Antonio Ventura - Traveset - Datapixel
Secciones
- A novel Amorphous Silicon Position Detector for multipoint monitoring systems, Iván Vila Álvarez - Instituto de Física de Cantabria
- Investigation Of The Phase-Change Correction Used For Gauge Block Calibration By Laser Interferometer, Adisak Phuaknoi - National Institute of Metrology Thailand, NIMT
- Computed Tomography on its way towards a fully accepted coordinate measuring technique, Dr. Markus Bartscher - PTB
- Step gauges and CMM Traceability. Historical Study and international Comparisons, Emilio Prieto Esteban - CEM length division
- Interferometric algorithms in gauge block calibration for dimensional metrology, Higinio Gonzalez Jorge - Micro and Nanotechnology area of Metrology Laboratory of Galicia
- METROLOGY WITH µCT - PRECISION CHALLENGE, Jens Luebbehuesen - Phoenix-xray
- Found in the Clouds, Josep Forest - AQSence
- Presentation title pending on confirmation, Maurizio Ercole - IACMM
- Presentation title pending on confirmation, Óscar Lázaro - Asociación Innovalia
- OSIS- an successful industry initiative, Otto Boucky - Carl Zeiss
- New sensor for nm-resolution, 2D-displacement monitoring of manufacturing and metrology frames, Dr. Joseph Tobiason - Micro Encoder, Inc.