Programa
Estos son los ponentes programados hasta ahora . Comprueba esta página habitualmente para actualizaciones posteriores. Haz click en el ponente para obtener más información.
Bandwidth characteristics and comparisons of surface texture measuring instruments Dr. Han Haitjema - Mitutoyo Research Center Europe B.V. 
Present and future of image sensors. (How megapixel sensor technology can help optical metrology) Martin Wäny - AWAIBA
Co-ordinate Measuring Machines; an overall analysis after almost 50 years. Dr. Maurizio Ercole - Independent Researcher
Aeronautical Metrology Dr. William Zhang - NASA Goddard Space Flight Center
A 100 million 3D pointcloud, and now what? The art of transforming massive data in useful knowledge Antonio Ventura - Traveset - Datapixel
Interferometric length measurements Prof. Erkki Ikonen - Metrology Research Institute Helsinki University of Technology
Comparison between 3D Metrology Results gained with conventional CMM and High Resolution X-ray Tomography Jens Luebbehuesen - GE's Sensing & Inspection Technologies business
Nano-CMM instrumentation for large volume characterization of 3D micro-features: The Nano-CMM approach Dr. Oscar Lazaro - Asociacion Innovalia
Machine tool spindle measurement Don Martin - Lion Precision
Laser scanning performance Vs traditional contact measurement Borja de la Maza - Innovalia
Lens assembly of laser diode stacks Dr. Sead Doric - Doric Lenses
Optical and Tactile- Comparisons in Contour and Surface Metrology Dr. -Ing. Dietrich Imkamp - Carl Zeiss Indutrial Metrology
Precision in the AutoEmoción Ramon Paricio - SEAT
Traceable Measurement of 3D Microparts Marijn van Veghel - VSL
Quality control in aerospace precision castings manufacturing process. Advances and challenges Ignacio Dominguez - PCB
Next generation of micro parts Ernst Treffers - Xpress Precision Engineering
Microscale surface and form profilometry using a standing wave probe Dr. Marcin B. Bauza - InsituTec Inc
Nanopositioning and Nanomeasuring Machines – 3D from Macro to Nano Prof. Dr.-Ing. Eberhard Manske - Ilmenau University
Uncertainty determination for CMMs -- Don´t forget the influence of feature form deviations Nick Van Gestel - Dimensional Metrology at Sirris and K.U.Leuven 
Verification of coordinate measuring machines according to ISO 10360-2 Felipe Pereda - Unimetrik
Modeling for Industrial Nanometer-Scale Size Metrology Dr. John Villarrubia - NIST
Metrological Software Validation Maite Tamayo - Michal Janiszek - SQS
Software advances for high performance tactile scanning Jordi Blanco - Renishaw
The development of optical metrology software during the years. An overview of available tools, the special needs for optical metrology data and actual trends. Gerd Schwaderer - Geomagic