Programa

Estamos trabajando en el programa para la edición de Metromeet 2012. Visite regularmente esta página para conocer las novedades en el programa.

• 3D Machine Vision – An Overview Gabriele Jansen - Vision Ventures GMBH & CO. KG
• Nanotechnology Roadmap Michael Meador Ph.D - NASA
• Metrology for Additive Manufacturing Opportunities in a Rapidly Emerging Technology Thomas Campbell, Ph.D. - (ICTAS), Virginia Tech
• How accurate are Computed Tomography dimensional measurements? Simone Carmignato - University of Padova

• The digital metrology workflow, a new paradigm for the knowledge based manufacturing Antonio Ventura - Traveset - Innovalia Metrology
• Nano-metrology; Accuracy of interferometric measurements Dr. Han Haitjema - Mitutoyo

• Successful integration of metrological functions in discrete part manufacturing Iñigo Perez - Engine Power Components
• A new Concept for High-Speed atline and inlineCT for up to 100% Mass Production Process Control Jens Lübbehüsen - GE
• 3D and metrology in an unusual and very challenging environment: the In Vessel Viewing System (IVVS) of ITER Ignazio Piacentini - Imaging Lab

• Advanced point cloud information management for inline quality control Dr. Oscar Lazaro - Asociacion Innovalia
• Metrological solutions for diffractive optics manufacturing Pere Pont - Datapixel

• Pending Title Dr. Reiner Götzen - microTEC Gesellschaft für Mikrotechnologie mbH
• Pending Title Javier Díaz - Seat
• Pending Title Nick Orchard - Rolls-Royce plc

• A two-dimensional moving platform with nanometer resolution to increase the measuring range of AFMs José A. Yagüe-Fabra PhD. - Universidad de Zaragoza
• Pending Title Javier O. Vera - Bruker Nano Surfaces Division
• Magneto-Optical Measurement techniques for Magnetic Materials Metrology Dr. Andreas Berger - CIC nanoGUNE

• Measurement uncertainty associated with coordinate measurements: evaluation and reduction Maryna Galovska - (IPROM), Technische Universität Braunschweig
• Large Machine tool 5 DOF Verification Aitor Olarra - IK4 – Tekniker

• The future of Metrological Software Jon Maurolagoitia - CBT
• Pending Title Ray Karadayi - AAT