Programa
| 08:30 - 09:00 Registration + Coffee | ||
| 09:00 - 11:15 Tutorial 1 | 09:00 - 11:15 Tutorial 2 | |
| 09:00 - 11:15 The digital metrology workflow, a new paradigm for the knowledge based manufacturing Antonio Ventura - Traveset, Innovalia Metrology (Spain) |
09:00 - 11:15 Nano-metrology; Accuracy of interferometric measurements Dr. Han Haitjema, Mitutoyo (The Netherlands) |
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| 11:15 - 12:00 Coffee Break + MetroLab | ||
| 12:00 - 12:30 Opening | ||
| 12:30 - 13:30 Keynote | ||
Metrology for Additive Manufacturing Opportunities in a Rapidly Emerging Technology Thomas Campbell, Ph.D., (ICTAS), Virginia Tech (USA) |
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| 13:30 - 15:00 Lunch | ||
| 15:00 - 17:15 | Track 1 - Metrology solutions | 15:00 - 17:15 | Track 2 - Optical Metrology | |
| 15:00 - 15:45 Successful integration of metrological functions in discrete part manufacturing Iñigo Perez, Engine Power Components (Spain)15:45 - 16:30 A new Concept for High-Speed atline and inlineCT for up to 100% Mass Production Process Control Jens Lübbehüsen, GE (Germany)16:30 - 17:15 Ignazio Piacentini, Imaging Lab (Italy) |
15:00 - 15:45 Advanced point cloud information management for inline quality control Dr. Oscar Lazaro, Asociacion Innovalia (Spain)15:45 - 16:30 Metrological solutions for diffractive optics manufacturing Pere Pont, Datapixel (Spain)16:30 - 17:15 Pending for confirmation |
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| 17:15 - 18:15 Keynote | ||
How accurate are Computed Tomography dimensional measurements? Simone Carmignato, University of Padova (Italy) |
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| 20:30 - 23:00 Conference Banquet | ||
| 09:30 - 10:30 Keynote | ||
3D Machine Vision – An Overview Gabriele Jansen, Vision Ventures GMBH & CO. KG (Germany) |
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| 10:30 - 11:15 Coffee Break | ||
| 11:15 - 13:30 | Track 3 - Industrial Metrology | 11:15 - 13:30 | Track 4 - Nano & Micrometrology | |
| 10:45 - 11:30 Dr. Reiner Götzen, microTEC Gesellschaft für Mikrotechnologie mbH (Germany) 12:00 - 12:45 Javier Díaz, Seat (Spain) 12:45 - 13:30 Nick Orchard, Rolls-Royce plc (United Kingdom) |
10:45 - 11:30 Magneto-Optical Measurement techniques for Magnetic Materials Metrology Dr. Andreas Berger, CIC nanoGUNE (Spain)12:00 - 12:45 Javier O. Vera, Bruker Nano Surfaces Division (USA) 12:45 - 13:30 A two-dimensional moving platform with nanometer resolution to increase the measuring range of AFMs José A. Yagüe-Fabra PhD., Universidad de Zaragoza (Spain) |
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| 13:30 - 15:00 Lunch | ||
| 15:00 - 16:30 | Track 5 - Calibration & Verification | 15:00 - 16:30 | Track 6 - Metrological Software | |
| 15:00 - 15:45 Large Machine tool 5 DOF Verification Aitor Olarra, IK4 – Tekniker (Spain)15:45 - 16:30 Measurement uncertainty associated with coordinate measurements: evaluation and reduction Maryna Galovska, (IPROM), Technische Universität Braunschweig (Germany) |
15:00 - 15:45 The future of Metrological Software Jon Maurolagoitia, CBT (Spain)15:45 - 16:30 Ray Karadayi, AAT (USA) |
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| 16:30 - 17:30 Keynote | ||
| Michael Meador Ph.D, NASA (USA) | ||
| 17:30 - 18:00 Round Table | ||
| 18:00 - 18:30 Farewell Cocktail | ||
Todas las presentaciones tendrán traducción simultánea.
* The organization reserves the right to reschedule, add or cancel presentations.
La organización se reserva el derecho a modificar horarios, añadir o cancelar presentaciones.
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