METROMEET - 5th International Conference on Industrial Dimensional Metrology

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Programme

A 100 million 3D pointcloud, and now what? The art of transforming massive data in useful knowledge

Antonio Ventura - Traveset
Datapixel - Spain

Presentation abstract

High speed scanning technologies are offering unprecedented capabilities to capture huge amounts of dimensional data in very short time. The new systems are offering fantastic possibilities for industrial manufacturers to monitor, control and assist fabrication processes, reducing time and cost, and increasing the accuracy and feasibility of the manufacturing methods.

Nevertheless, creating data files of millions of 3D points is creating new challenges in information storage, management, and what is more important, in analysis and transformation of the data in useful knowledge. New methods of data analysis and processing are needed, not only to be able to summarize the data in valuable and useful information, but to optimize the use of the systems by the engineering teams.

Managing massive data and transforming data in knowledge is not an exclusive problem of modern dimensional metrology, but an old problem in natural and social sciences. The tutorial is presenting first of all the concept of “knowledge”, and the implications in metrology. From these basic ideas, different approaches to dimensional data analysis are presented, starting with simple methods and evolving to more sophisticated methods.

The tutorial explores the pros and cons of the different pointcloud processing and analysis methods, when to be utilized and under what conditions and requirements. The final goal is to stimulate new ideas to the audience, based in a structured and comprehensible set of techniques and methods that can be useful in practical and real industrial situations.

Information about the speaker

Telecommunications Engineer (option: Electronics) from the Polytechnic University of Catalonia (UPC), Spain.

Founder and General Manager of DATAPIXEL in Spain. Specialized Technological Consultant for CARSA.

He is Member of the Executive Committee of the European Machine Vision Association (EMVA) and of some international committees working on standards, one of them is the OSIS committee (Optical Sensor Interface Standard) of the ia.cmm.

Former Manager of the Computer Vision Centre (CVC). Author of a great variety of technicals papers and seminars in Computer Vision, Image Processing, 3D Vision y Virtual Metrology for the industrial and medical areas.