Programme
| 08:30 - 09:00 Registration + Coffee | ||
| 09:00 - 11:15 Tutorial 1 | 09:00 - 11:15 Track 1 + Metrology Solutions | |
| 09:00 - 11:15 A 100 million 3D pointcloud, and now what? The art of transforming massive data in useful knowledge Antonio Ventura - Traveset, Datapixel (Spain) |
09:00 - 09:45 Jens Luebbehuesen, GE's Sensing & Inspection Technologies business (Germany) 09:45 - 10:30 Dr. Oscar Lazaro, Asociacion Innovalia (Spain) 10:30 - 11:15 Machine tool spindle measurement Don Martin, Lion Precision () |
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| 11:15 - 12:00 Coffee Break + MetroLab | ||
| 12:00 - 12:30 Opening | ||
| 12:30 - 13:30 Keynote | ||
Present and future of image sensors. (How megapixel sensor technology can help optical metrology) Martin Wäny, AWAIBA () |
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| 13:30 - 15:00 Lunch | ||
| 15:00 - 17:15 Tutorial 2 | Track 2 + Optical Metrology | |
| 15:00 - 17:15 Interferometric length measurements Prof. Erkki Ikonen, Metrology Research Institute Helsinki University of Technology (Finland) |
15:00 - 15:45 Optical and Tactile- Comparisons in Contour and Surface Metrology Dr. -Ing. Dietrich Imkamp, Carl Zeiss Indutrial Metrology (Germany)15:45 - 16:30 Laser scanning performance Vs traditional contact measurement Borja de la Maza, Innovalia (Spain)16:30 - 17:15 Lens assembly of laser diode stacks Dr. Sead Doric, Doric Lenses (Canada) |
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| 17:15 - 18:15 Keynote | ||
Bandwidth characteristics and comparisons of surface texture measuring instruments Dr. Han Haitjema, Mitutoyo Research Center Europe B.V. (The Netherlands) |
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| 20:30 - 23:00 Conference Banquet | ||
| 09:00 - 10:00 Keynote | ||
Co-ordinate Measuring Machines; an overall analysis after almost 50 years. Dr. Maurizio Ercole, Independent Researcher (Italy) |
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| 10:00 - 10:45 Coffee Break + MetroLab | ||
| Track 3 + Industrial Metrology | Track 4 + Nano & Micrometrology | |
| 10:45 - 11:30 Ramon Paricio, SEAT (Spain) 11:30 - 12:15 Traceable Measurement of 3D Microparts Marijn van Veghel, VSL (The Netherlands)12:15 - 13:00 Quality control in aerospace precision castings manufacturing process. Advances and challenges Ignacio Dominguez, PCB (Spain) |
10:45 - 11:30 Next generation of micro parts Ernst Treffers, Xpress Precision Engineering (The Netherlands)11:30 - 12:15 Microscale surface and form profilometry using a standing wave probe Dr. Marcin B. Bauza, InsituTec Inc (USA)12:15 - 13:00 Nanopositioning and Nanomeasuring Machines – 3D from Macro to Nano Prof. Dr.-Ing. Eberhard Manske , Ilmenau University (Germany) |
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| 13:00 - 14:30 Lunch | ||
| 14:30 - 15:30 Keynote | ||
| Dr. William Zhang, NASA Goddard Space Flight Center (USA) | ||
| Track 5 Calibration & Verification | Track 6 + Metrological Software | |
| 15:30 - 16:15 Uncertainty determination for CMMs -- Don´t forget the influence of feature form deviations Nick Van Gestel, Dimensional Metrology at Sirris and K.U.Leuven (Belgium)16:15 - 17:00 Verification of coordinate measuring machines according to ISO 10360-2 Felipe Pereda, Unimetrik (Spain)17:00 - 17:45 Modeling for Industrial Nanometer-Scale Size Metrology Dr. John Villarrubia, NIST (USA) |
15:30 - 16:15 Gerd Schwaderer, Geomagic (Germany) 16:15 - 17:00 Metrological Software Validation Maite Tamayo - Michal Janiszek, SQS (Spain)17:00 - 17:45 Software advances for high performance tactile scanning Jordi Blanco, Renishaw (Spain) |
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| 17:45 - 18:15 Round Table | ||
| 18:15 - 19:00 Closing Cocktail | ||
Todas las presentaciones tendrán traducción simultánea.
* The organization reserves the right to reschedule, add or cancel presentations.
La organización se reserva el derecho a modificar horarios, añadir o cancelar presentaciones.