Programme
| 08:30 - 09:00 Registration + Coffee | ||
| 09:00 - 11:15 Tutorial 1 | 09:00 - 11:15 Tutorial 2 | |
| 09:00 - 11:15 Information management standards for digital metrology: from data to knowledge Toni Ventura-Traveset, Datapixel (Spain) |
09:00 - 11:15 Statistical data processing in coordinate metrology: standards, approaches and realization Maryna Galovska, Institut für Produktionsmesstechnik, TU Braunschweig (Germany) |
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| 11:15 - 12:00 Coffee Break + MetroLab | ||
| 12:00 - 12:30 Opening | ||
| 12:30 - 13:30 Keynote | ||
Metrology at F4E ( fusion For Energy) Dr. Luigi Semeraro , Fusion for Energy (Spain) |
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| 13:30 - 15:00 Lunch | ||
| 15:00 - 17:15 | Track 1 - Metrology solutions | 15:00 - 17:15 | Track 2 - Optical Metrology | |
| 15:00 - 15:45 3D Metrology Process Control with High-Speed Helix Computed Tomography Jens Lübbehüsen, GE - Measurement & Control (Germany)15:45 - 16:30 In Process Metrology on Large and Multi Axes Machining Centers Ray Karadayi, Applied Automation Technologies, Inc. (USA)16:30 - 17:15 Advanced semiconductor manufacturing metrology : status and challenges Philippe Maillot, STMicroelectronics (France) |
15:00 - 15:45 Design and validation of a virtual prototype, using structuredlight simulation software Bart Ribbens, Artesis University College Antwerp (Belgium)15:45 - 16:30 Fibrescopic Micro Fringe Projection Dipl.-Ing.(FH) Christoph Ohrt , Institute of Measurement- und Automatic Control (Germany)16:30 - 17:15 Scalable Automation for emerging Lab Production Pere Pont, Datapixel (Spain) |
17:15 - 18:15 Keynote |
Metrological software: from testing to certification Begoña Laibarra, SQS (Spain) |
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| 20:30 - 23:00 Conference Banquet | ||
| 09:30 - 10:30 Keynote | ||
Nanometrology for self-assembly nanofabrication methods Prof. Dr. Clivia Sotomayor, Catalan Institute of Nanotechnology (Spain) |
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| 10:30 - 11:15 Coffee Break | ||
| 11:15 - 13:30 | Track 3 - Micro & Nanometrology | 11:15 - 13:30 | Track 4 - Metrological Software | |
| 11:15 - 12:00 State-of-the-art physical and chemical characterization for the nanoelectronic industry Narciso Gambacorti, Commissariat à l’énergie atomique et aux énergies alternatives (France)12:00 - 12:45 Dimensional nanometrology at PTB Dr. Hans Danzebrink, PTB (Germany)12:45 - 13:30 Dr. Bartosz Nowakowski, NIST (USA) |
11:15 - 12:00 Performance evaluation of 3D imaging systems based on GD&T Benjamin Carrier, National Research Council of Canada (Canada)12:00 - 12:45 Dr. Oscar Lázaro, Asociación Innovalia (Spain) 12:45 - 13:30 Metrology Throughout the Organisation Michael Stones, Delcam (United Kingdom) |
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| 13:30 - 15:00 Lunch | ||
| 15:00 - 16:30 | Track 5 - Industrial Metrology | 15:00 - 16:30 | Track 6 - Calibration & Verification | |
| 15:00 - 15:45 Knowledge-based optimisation by extensive control and data acquisition in milling Dipl.-Ing. Reik Krappig , Fraunhofer-Institut für Produktionstechnologie IPT (Germany)15:45 - 16:30 3D Experience industry solutions for optimizing the manufacturing process Daniel Pyzak, Dassault Systèmes (France) |
15:00 - 15:45 Periodic verification of three-coordinate measuring machines based on ISO 10360 Felipe Pereda, Unimetrik (Spain)15:45 - 16:30 Numerical compensation of volumetric error positioning on large machine tools Aitor Olarra, Tekniker (Spain) | |
| 16:30 - 17:30 Round Table | ||
Todas las presentaciones tendrán traducción simultánea.
* The organization reserves the right to reschedule, add or cancel presentations.
La organización se reserva el derecho a modificar horarios, añadir o cancelar presentaciones.
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