Call for papers
Do not miss the chance to submit papers to this prestigious International Conference on Industrial Dimensional Metrology that has caught the interest of professionals around the world.
Deadline for Abstracts: 18th September 2008
Send us your summary of the presentation before the 18th of September 2008.
The best speaker of the Conference will receive an award for METROMEET 2009 Best Paper.
You can send all the documentation by e-mail (info@metromeet.org) or using the form you will find in the Submit Abstract page.
Tutorials
Tutorials offer you insight into the technologies, tools, instruments and working methods showing clearly and concise the practical aspects involved in their implementation. Tutorials will last 1 hour and 45 minutes with 15 minutes for questions.
Tracks
On the other hand presentations discuss current topics of Industrial Metrology, State of the Art, problems and solutions, quality requirements, norms, etc.
Presentations will last 30 minutes with 15 minutes for questions.
Deadline: 18th September 2008.
Documentation:
- Summary of the presentation / tutorial
- Full description of your CV with and he author´s contact information (email and telephone)
- Presentation showing the content of the paper (10 sliders)
Topics
- Academic Education in Metrology
- Acreditation and Certification
- Advances of micro- and nanometrology
- Future trends in metrological R&D
- Latest developments and solutions in the area of optical non-contact measurement and 3D digitalisation systems
- Measurement problems of large work pieces and their solutions
- Methods, organisation and best practices in the area of industrial metrology
- Metrology and economics
- New developments in measurement instruments
- New developments in Virtual Metrology
- Overview of industrial process quality requirements and metrology-based process improvements
- Recent developments in the area of metrological software
- Solutions for in-line inspection
- State of the art and challenges of multi-sensor coordinate metrology
- Uncertainty, traceability and reliability of measurements with CMMs
- GD&T