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Metromeet 2010 launches the Call for Papers

Metromeet invites international professionals and experts on Industrial Dimensional Metrology to participate in the 6th edition of this Conference with the Call for Papers. From 28th April till 31st July, you can send your abstract by email or by the web form.
There are three different lectures: tutorials that will last two hours; presentations of 45 minutes, and keynotes with duration of 1 hour.
Click here to know more about Call for Papers

Bill Rippey, wins the Best Speaker Award at Metromeet

The Best Speaker Award of Metromeet 2009 has won by Bill Rippey (NIST), for his keynote DMSC Offers New DMIS Certification to Enable Interoperatibility, about the DMIS Certification Programing, announced by the Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology at the International Manufacturing Technology Show (IMTS) 2008.
His experience and the high quality of his keynote, make Bill Rippey fair winner of the Best Speaker Award of Metromeet 2009.

Metromeet closes successfully the 5th edition

Metromeet, the International Conference on Industrial Dimensional Metrology, held a very successful 5th edition in Bilbao, Spain. Metromeet has had more than 120 delegates from all over the world; Argentina, USA, United Kingdom, Holland, Germany, Russia, Spain, Italy, Thailand. Our guests could enjoy two tutorials, four keynotes and 25 presentations divided into 7 tracks. This year we had a new track; Metrology & Sport, congregated a lot of attendees, who wanted to know different applications of Metrology. Because of the enthusiastic response, the organisation will repeat this track next year as well. One of the learnings of the conference is that Nano technology is growing in importance. In several presentations the attendees could learn about this fascinating subject.
In the 5th edition, Metromeet has been consolidated as the most important Conference on Industrial Dimensional Metrology, and confirms itself as an active forum to exchange knowledge and experience between professionals of the metrological industry. Metromeet would like to thank all speakers for their contribution of the high quality of the presentations. We hope to see all of you again in 2010!