Metromeet, the International Conference on Industrial Dimensional Metrology

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Speaker of the week

Simone Carmignato - University of Padova

Simone Carmignato is Assistant Professor of Manufacturing Engineering at the Department of Management and Engineering (DTG) of the University of Padova and he will be presenting on Metromeet for the 2^nd time. His presentation will discuss the results of the first international interlaboratory comparison of Computed Tomography systems for dimensional metrology. The comparison involved 15 CT systems in Europe, America and Asia, including national metrology institutes, CT systems manufacturers, and industrial users.

His presentation will discuss the results of the first international interlaboratory comparison of Computed Tomography systems for dimensional metrology. The comparison involved 15 CT systems in Europe, America and Asia, including national metrology institutes, CT systems manufacturers, and industrial users.

TITLE:

How accurate are Computed Tomography dimensional measurements?

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Aitor Olarra - IK4 – Tekniker

Antonio Ventura - Traveset - Innovalia Metrology

Dr. Andreas Berger - CIC nanoGUNE

Dr. Han Haitjema - Mitutoyo

Dr. Oscar Lazaro - Asociacion Innovalia

Dr. Reiner Götzen - microTEC Gesellschaft für Mik

Gabriele Jansen - Vision Ventures GMBH & CO. KG

Iñigo Perez - Engine Power Components

Ignazio Piacentini - Imaging Lab

Javier Díaz - Seat

Javier O. Vera - Bruker Nano Surfaces Division

Jens Lübbehüsen - GE

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Jon Maurolagoitia - CBT

José A. Yagüe-Fabra PhD. - Universidad de Zaragoza

Maryna Galovska - (IPROM), Technische Universit�

Michael Meador Ph.D - NASA

Nick Orchard - Rolls-Royce plc

Pere Pont - Datapixel

Ray Karadayi - AAT

Simone Carmignato - University of Padova

Thomas Campbell, Ph.D. - (ICTAS), Virginia Tech

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Themes

Nano-metrology; Accuracy of interferometric measurements

Nanometrology will be in the spotlight during Metromeet; besides one track formed by three presentations, Dr. Han Haitjema will give a 2 hours Tutorial in which he will explain how interferometric measurements play a role in nanometrology, including the various techniques employed for obtaining nanometer resolutions and accuracy. Register today for Metromeet and don't miss the latest advances in nanometrology.

Metromeet opened a Twitter account

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RSVP our Conference

RSVP your stay at Metromeet at Linkedin and see who is coming. Join us on our Linkedin group and increase your network!

Keynotes MetroMeet 2012

We are proud to announce the first Keynotes of the 2012 edition; Michael Meador Ph.D - NASA, Thomas Campbell, Ph.D. - (ICTAS), Virginia Tech and Gabriele Jansen - Jansen CEO /EMVA. Besides those renowned Keynotes, there will speakers from Mitutoyo, Imaging Lab, Micro electronics, Bruker, Innovalia Metrology, University of Padova and many more. Please visit the preliminary program to see all speakers of the 8th edition of Metromeet.

Extended Deadline for Call for Papers (15-10-2011)

The organization of Metromeet received a lot of requests to extend the deadline of the Call for Papers. The International Technical Committee of Metromeet would like to encourage you to submit your paper; the extended deadline is 15-10-2011. Now you have a new opportunity to send your paper and participate on this Conference. METROMEET will bring you the possibility of establishing direct contact with directors and senior executives of the Metrology Sector.

For more detailed information how to submit your abstract, please click here.

Call for papers Metromeet 2012

Metromeet 2011 closed the doors last week; it was a fantastic edition with presentations of exceptional level. The organisation would like to thank all speakers for their effort. The call for papers for Metromeet 2012 will start the first of May 2011. We invite you to join this call. All information about the Call for papers will be published on this website.