Programm
Uncertainty determination for CMMs -- Don´t forget the influence of feature form deviations
Nick Van Gestel
Dimensional Metrology at Sirris and K.U.Leuven - Belgium
Resumen de la ponencia
Reliable quality control is impossible without specification of the measurement uncertainty. For feature measurements with coordinate measuring machines (CMMs), determination of the measurement uncertainty is not easy. Today, Monte Carlo simulation allows to integrate the many task specific uncertainty influences. Yet, the influence of possible feature form deviations is seldom incorporated in such simulations. This presentation shows that limited sampling in combination with feature form deviations is often an important uncertainty contributor for CMM measurements. A simulation method that determines uncertainties for CMM measurements is presented, taking into account the influence of feature form deviations. The method is integrated in CMM software and results are validated on actual parts.
Información sobre el ponente
Nick Van Gestel is senior PhD researcher at K.U.Leuven University co-author Philip Bleys obtained the degree of mechanical engineer - option manufacturing technology from K.U.Leuven University in 1996. After his studies, he worked as engineering researcher in production technology at the Department of Mechanical Engineering at the same university. He obtained the PhD degree in 2003 for research in the field of Electrical Discharge Machining.
After his research in production technology, Philip Bleys became postdoctoral researcher in the field of Dimensional Metrology. Since 2004, he is consultant Dimensional Metrology for Sirris, the Collective Center of the Belgian Technology Industry. In this function, he gives technological advice to industry on dimensional metrology, quality control and machine tool measurement.